http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4675601-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_230c5c9d495e3bf392ef2b8098e51921
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-265
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-265
filingDate 1985-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1987-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8886af0a23865703ac82c4ed3be79192
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_045d9206d47c1263e0e7c7220a3d762c
publicationDate 1987-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4675601-A
titleOfInvention Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
abstract Electric-field funneling length is measured while irradiating a semiconductor charge-collecting junction with electron-hole-pair generating charged particles at a first junction bias voltage. The bias voltage is then reduced to a second level in order to reduce the depth of the depletion region such that the total charge can no longer be collected by drift and measured in the energy band previously displayed in the multichannel analyzer. This is representative of the maximum electric field funnelling length which may be calculated by measuring the difference at the second bias voltage level of the depletion width and the ion penetration range. The bias voltage is further lowered to a third level at which the particles are collected over a spread of energy levels while at least some of the particles are still collected at the selected energy level. From this the different depths of penetration of the particles are determined while additional effects due to diffusion are minimized.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4968932-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005500665-A
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0310082-A1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4711622-B2
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5942909-A
priorityDate 1985-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.