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filingDate 1984-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1987-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_07957016b085930d0a8169152a62c0d7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d5fd30be7648a66608a17987c732c246
publicationDate 1987-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4652812-A
titleOfInvention One-sided ion migration velocity measurement and electromigration failure warning device
abstract Cathode migration is reduced by increasing the width of the cathode at its leading edge compared to the width of the anode at its leading edge. Electromigration to a specific degree may be measured by placing an additional conductor connected to the anode portion of the base conductor and separated from the anode by the base conductor. A rapid change in resistance can be sensed as the anode electrically migrates past the additional conductor.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009108855-A1
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Total number of triples: 37.