http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4588945-A

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filingDate 1983-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1986-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_65b6ac63c33d866396e77ba4a702776a
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publicationDate 1986-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4588945-A
titleOfInvention High throughput circuit tester and test technique avoiding overdriving damage
abstract A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital incircuit test techniques.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0415319-A3
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Total number of triples: 55.