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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 1974-10-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1975-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_62cc5e308cfc0c40b9fb0c5d00729119
publicationDate 1975-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-3904962-A
titleOfInvention Impatt diode testing
abstract A pulse technique and network are described for measuring the reverse leakage current of an operating IMPATT diode. Observation under substantially operating conditions is attained by pulsing the diode under test out of the avalanche condition very briefly and observing the reverse leakage current. High reverse leakage currents under these conditions indicate likelihood of ''''short out'''' failure.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109212401-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109212401-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108896897-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5027064-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108896897-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102944824-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4238732-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4575675-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009096479-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110763971-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5623215-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110763971-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4739252-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7868637-B2
priorityDate 1974-10-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 30.