| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6ce4758325af2ede65a037ebe14d8c39 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-263 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
1961-02-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1965-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5d11425456b6c96244d0b7c96f089c25 |
| publicationDate |
1965-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-3193766-A |
| titleOfInvention |
Controlled silicon rectifier test apparatus for determining defects and operating characteristics |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-B337703-I5
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3914690-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3478264-A |
| priorityDate |
1961-02-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |