| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c2bce2681c3d6fffd856bee389b94b60 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2608 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
1957-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1961-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f6563f82f2b83a1909dec11ea1ee36c3 |
| publicationDate |
1961-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2982916-A |
| titleOfInvention |
Transistor test devices |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9575092-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017115341-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3549996-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014312925-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3226642-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3332015-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10254332-B2 |
| priorityDate |
1957-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |