| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cd8dff0cc6d024e095d5decaf9202f49 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
1950-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1954-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3107148b9342ad963e218bfa245fc73c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c45a14af59dbe9d9ae9d266e674b5487 |
| publicationDate |
1954-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2677106-A |
| titleOfInvention |
Testing of semiconductors |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2928950-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3405270-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2790952-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3760182-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3039056-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2805347-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-3590372-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102010052701-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2863119-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2844737-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2911594-A |
| priorityDate |
1950-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |