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publicationDate 2022-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2022120662-A1
titleOfInvention Particle inspection device based on spatial modulation method and particle inspection method using the particle inspection device
abstract A particle inspection method includes irradiating a spatially modulated modulation beam onto a surface of a substrate and detecting an absorption light signal from a reflection beam generated through reflection of the spatially modulated modulation beam by the substrate.
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