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filingDate 2020-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2022-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2022093588-A1
titleOfInvention Adjacent gate-all-around integrated circuit structures having non-merged epitaxial source or drain regions
abstract Adjacent gate-all-around integrated circuit structures having non-merged epitaxial source or drain regions, and methods of fabricating adjacent gate-all-around integrated circuit structures having non-merged epitaxial source or drain regions, are described. For example, an integrated circuit structure includes a first vertical arrangement of nanowires and a second vertical arrangement of nanowires above a substrate. One or more gate stacks is over the first and second vertical arrangements of nanowires. First epitaxial source or drain structures are at ends of the first vertical arrangement of nanowires. Second epitaxial source or drain structures are at ends of the second vertical arrangement of nanowires. An intervening dielectric structure is between adjacent ones of the first epitaxial source or drain structures and between adjacent ones of the second epitaxial source or drain structures.
priorityDate 2020-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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