http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022068598-A1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b26deb5501c8c3e152ec117a023ec0c9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_92d71a3e23389a3bca747290fc6464cf
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2204
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-362
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2602
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2813
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2202
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-00009
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-2813
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-32532
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-28
filingDate 2019-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7aa69ec42705ba44685a11534eb4b46c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3ece543c99e2729b6feb7322bef6289f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1daf187210abfbb1876d9a5d24c5f20a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_215c4d97d9851f76b4e81281d36ab910
publicationDate 2022-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2022068598-A1
titleOfInvention Sample preparation system and method for electron microscope observation, plasma treatment apparatus, sputtering apparatus, and tape feeding mechanism used for sample preparation
abstract Sample preparation system and method which enable electron microscope observation of a sample slice with simple structure and process are provided. The sample preparation system includes at least one of a plasma treatment apparatus and a sputtering apparatus, as well as a slice collecting apparatus. The plasma treatment apparatus is configured to feed a resin tape in a plasma irradiation area to irradiate the resin tape with plasma, thereby continuously hydrophilizing the resin tape. The sputtering apparatus is configured to feed the resin tape in a sputtering area to continuously perform sputtering on the resin tape, thereby imparting conductivity to the resin tape. The slice collecting apparatus is configured to serially collect slices cut out from a sample onto the resin tape having been subjected to plasma treatment or sputtering.
priorityDate 2018-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID226599654
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID10982

Total number of triples: 29.