| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4789564ea658d6ee8e4328824a58057d |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2617
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2608
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2894
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2607
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2621
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2623
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2633 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2020-08-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f90ec352623313fc248a8d894c035203
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b5e5e992381ca3f2fb157358cf04907a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59dd5cd4d3d16adc3009d6cd643acf8a |
| publicationDate |
2022-02-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2022043048-A1 |
| titleOfInvention |
Device and method for testing semiconductor devices |
| abstract |
A testing circuit includes a first circuit and a second circuit. The first circuit has a first capacitor and a second capacitor. The first circuit is configured to transfer at least a portion of a first voltage across the first capacitor to the second capacitor. The second circuit has the first capacitor and the second capacitor. The second circuit is configured to transfer at least a portion of a second voltage across the second capacitor to the first capacitor. |
| priorityDate |
2020-08-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |