| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23a4e0c875bf1ac2b8a3b76517de6c7d |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-028 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-165
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-72
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61F13-38
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-14503
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0459
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B10-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0409
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7282 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-145
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-72
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B10-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61F13-38 |
| filingDate |
2021-04-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_baf132303f753a0fec5cf26717035e27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6b3cd1a4557b893510733fd258cea988
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4dff7985aec161ef3223480528a65728 |
| publicationDate |
2022-01-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2022005681-A1 |
| titleOfInvention |
Systems and methods for sample analysis using swabs |
| abstract |
The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer. |
| priorityDate |
2017-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |