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filingDate 2017-12-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6d5634685e7ddd3b03ec3aaa2ac34459
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publicationDate 2021-12-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2021405182-A1
titleOfInvention Millimeter wave and/or microwave imaging systems and methods including examples of partioned inverse and enhanced resolution modes and imaging devices
abstract Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022283285-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11709224-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2020319331-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2023206624-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022050193-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2021270933-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11770160-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2021133445-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11580725-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11715228-B2
priorityDate 2016-12-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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