| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3a2f00e72ba6e4c09b6da573427fbed |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C8-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-1204 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-802
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C8-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C8-08 |
| filingDate |
2020-02-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b846d42fec9e2888d65444b88efa3ed
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8fd2e01b318253f0bc141677c636be0b |
| publicationDate |
2021-08-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2021241842-A1 |
| titleOfInvention |
Microelectronic device testing, and associated methods, devices, and systems |
| abstract |
Memory devices are disclosed. A memory device may include a memory array including a number of column planes and at least one circuit coupled to the memory array. The at least one circuit may generate test result data for a column address for each column plane of the number of column planes. The at least one circuit may further convert the test result data to a first result responsive to two or more of the column planes failing the test. The at least one circuit may also convert the test result data to a second result responsive to no column planes failing the test. Further, the at least one circuit may convert the test result data to a third result responsive to one column plane failing the test. The third result may identify the one column plane. Methods of testing a memory device, and electronic systems are also disclosed. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022319581-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11581035-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022270668-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11514977-B2 |
| priorityDate |
2020-02-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |