| abstract |
Disclosed herein is a detector, comprising: a pixel comprising a first subpixel and a second subpixel, wherein the first subpixel is configured to generate a first electrical signal upon exposure to radiation, and wherein the second subpixel is configured to generate a second electrical signal upon exposure to the radiation; wherein the detector is configured to determine a number of particles of the radiation incident on the first subpixel over a first period of time, based on the first electrical signal; wherein the detector is configured to determine an intensity of the radiation by integrating the second electrical signal over a second period of time. |