Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_559ad63bd2d9b95bec02f1851b4bdf08 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06738 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2221-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-00 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06788 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 |
filingDate |
2020-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b5ba458d24b894d395f94700783b185d |
publicationDate |
2021-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2021156886-A1 |
titleOfInvention |
Conductive test probe |
abstract |
A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node. |
priorityDate |
2012-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |