| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e433c1625fc509a087c912b440da84b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-31701
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318552
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-30472
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318594 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318513
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318558
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3007
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318572
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2607
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3171
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3177 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3177
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-317 |
| filingDate |
2019-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a80d6a9d8c490ac9f2fe550425bf7876 |
| publicationDate |
2020-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2020116779-A1 |
| titleOfInvention |
Die stack test architecture and method |
| abstract |
A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating circuit. The top surface TDI signal may be coupled to the bottom surface TDO signal via TDO MX. This allows concatenating or daisy-chaining the IR and DR of a TCP of a lower die with an IR and DR of a TCP of a die stacked on top of the lower die. |
| priorityDate |
2012-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |