| abstract |
A particle characterisation instrument, comprising a light source, a sample cell, an optical element between the light source and sample cell and a detector. The optical element is configured to modify light from the light source to create a modified beam, the modified beam: a) interfering with itself to create an effective beam in the sample cell along an illumination axis and b) diverging in the far field to produce a dark region along the illumination axis that is substantially not illuminated at a distance from the sample cell. The detector is at the distance from the sample cell, and is configured to detect light scattered from the effective beam by a sample in the sample cell, the detector positioned to detect forward or back scattered light along a scattering axis that is at an angle of 0° to 10° from the illumination axis. |