| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_65bc91c56f9e6d3a4919a56ac7c7cb29 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-067 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-142
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2258
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0068
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-6848
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-58 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-68
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-00 |
| filingDate |
2019-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1f680d9dab25d1add859bab033ad191c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7ee47d945077f79006eb927f2a7e3656
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9695f64acf12e916e3eb320e2a497021
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b13cf6ece51b7665d3babde77bfe64b7 |
| publicationDate |
2019-07-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2019228958-A1 |
| titleOfInvention |
Ion beam focus adjustment |
| abstract |
The disclosure features systems and methods that include: exposing a biological sample to an ion beam that is incident on the sample at a first angle to a plane of the sample by translating a position of the ion beam on the sample in a first direction relative to a projection of a direction of incidence of the ion beam on the sample; after each translation of the ion beam in the first direction, adjusting a focal length of an ion source that generates the ion beam; and measuring and analyzing secondary ions generated from the sample by the ion beam after adjustment of the focal length to determine mass spectral information for the sample, where the sample is labeled with one or more mass tags and the mass spectral information includes populations of the mass tags at locations of the sample. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I798715-B |
| priorityDate |
2018-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |