| abstract |
The four-dimensional microscope includes a sample plate, a laser device, an aperture, an extraction plate, a hexapole, a quadrupole, a time-of-flight mass analyzer, a detector, and a device for supplying a voltage to the sample plate, the aperture, the extraction plate and the hexapole and the quadrupole. By utilizing the tunneling effect of photo-induced electrons on surfaces of semiconductor materials under laser irradiation and the electron capture ionization, mass-to-charge ratios and signal intensities of the ions resulting from the capture of interfacially transferred photo-induced electrons and subsequent photo-chemical reactions are measured, and image reconstruction is performed to obtain microscopic images. By using the present invention, not only active photo-catalytic sites of the semiconductor materials are imaged but also various structures of intermediates and products of photo-chemical reactions can be determined. |