Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2029-7858 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-535 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-743 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76897 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66795 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7853 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823821 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823475 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66545 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7855 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5226 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-522 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-535 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8234 |
filingDate |
2018-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4abdc4fed9f5690ece3e4cc124d3c2c8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e3e3e0e2a450375b8c45205fd01f1431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e08d91ff19fce642276d4cd68e163970 |
publicationDate |
2018-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2018248042-A1 |
titleOfInvention |
Independent gate finfet with backside gate contact |
abstract |
A method of making a semiconductor device includes forming a plurality of fins on a substrate, with the substrate including an oxide layer arranged beneath the plurality of fins. A sacrificial gate material is deposited on and around the plurality of fins. First trenches are formed in the sacrificial gate material. The first trenches extend through the oxide layer to a top surface of the substrate and are arranged between fins of the plurality of fin. First trenches are filled with a metal gate stack. Second trenches are formed in the sacrificial gate material, with a bottom surface of the second trenches being arranged over a bottom surface of the first trenches, and the second trenches being arranged between fins of the plurality of fins and alternating with the first trenches. The second trenches are filled with a metal gate stack. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019393098-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10529624-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11037834-B2 |
priorityDate |
2017-02-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |