Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7542cdde926ccc0ad7b27ea92c083088 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67092 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N5-372 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14683 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N5-376 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N25-74 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N5-378 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-304 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N25-75 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-302 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T3-4007 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14618 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N25-71 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-304 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-146 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T3-40 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-372 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-378 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-376 |
filingDate |
2016-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ba3165efde8b9787997026a0c21d50e1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1ca4885d2126c48a4a279602a678e6f0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f27710e5c3bc4e50206860d013b1be21 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_25e723c99e10f2882d11fb01527fe0f6 |
publicationDate |
2018-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2018076257-A1 |
titleOfInvention |
Strain Relieving Die for Curved Image Sensors |
abstract |
Techniques for fabricating a semiconductor die having a curved surface can include placing a substantially flat semiconductor die in a recess surface of a concave mold such that corners or edges of the semiconductor die are unconstrained or are the only portions of the semiconductor die in physical contact with the concave mold. The semiconductor die can include through-die cut lines that can lead to substantially less tension in the semiconductor die as compared to the case where the semiconductor die does not include through-die cut lines. Accordingly, such through-die cut lines can allow for achieving relatively large curvatures. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10600658-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10475668-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019140008-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11600655-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11335642-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022266025-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10991738-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10304900-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109003884-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10373995-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10304880-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11791277-B2 |
priorityDate |
2016-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |