http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018059166-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36f8253f3d0d59bcd9259217d4385d10 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2621 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-27 |
| filingDate | 2016-08-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8753cc5196881cb0bfc38a0c9dc7e732 |
| publicationDate | 2018-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-2018059166-A1 |
| titleOfInvention | Test Circuit for Stress Leakage Measurements |
| abstract | In accordance with an embodiment, a circuit includes: a gate drive circuit; an output transistor, and a gate coupled to the gate drive circuit; a normally-on transistor including a load path coupled to the gate drive circuit and to the gate of the output transistor; and a pull-up device, where the output transistor is configured to provide a test leakage current in a test mode when a measurement voltage is applied to a current test node coupled to the gate of the output transistor and a turn-off voltage is applied to the gate of the normally-on transistor; and the gate drive circuit is configured to provide a gate drive voltage to the gate of the output transistor in a nominal operation mode when a voltage of the gate of the normally-on transistor is pulled-up to a voltage of the pull-up node via the pull-up device. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018372791-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10725087-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-3085485-A1 |
| priorityDate | 2016-08-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID414861459 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7232 |
Total number of triples: 19.