http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017315148-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b4f16e71d2cc81c549e81470d725e224 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-58 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-58 |
| filingDate | 2017-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_368f9ab34c0976563a657d80311f2916 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ef918682b3f7d0ffbfd9233ecd880f9e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b939c6f94e58a5292ce4da93eab9ae29 |
| publicationDate | 2017-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-2017315148-A1 |
| titleOfInvention | Scanning thermo-ionic microscopy |
| abstract | A method of scanning probe microscopy includes supplying heat to a scanning probe. The method also includes receiving a scanning probe deflection signal, where the scanning probe deflection signal is indicative of a magnitude of deflection of the scanning probe when the scanning probe is engaged with a sample. A fourth harmonic signal is separated from the scanning probe deflection signal, and an ionic character of the sample is measured using the fourth harmonic signal. |
| priorityDate | 2016-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 17.