| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2e3830f35387a1c32061dea3ee310851 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2203-0246
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q10-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q80-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q30-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-24 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q70-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N19-02 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N19-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-26 |
| filingDate |
2017-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a08bc8cef04794838cb3980c20dbd3e1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a2b4a7843b88d64372eafae2c817f103 |
| publicationDate |
2017-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2017254740-A1 |
| titleOfInvention |
Situ tribometer and methods of use |
| abstract |
Techniques for determining a characteristic of a sample using an atomic force microscope including a cantilever having a probe attached thereto, including positioning the sample within a cell and sliding the probe over a sliding zone of the sample within the cell. Lateral and vertical deformations of the cantilever are detected using the atomic force microscope as the probe is slid over the sliding zone. One or more characteristics are determined based on the detected lateral deformations of the cantilever. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022099558-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10473552-B1 |
| priorityDate |
2014-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |