| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_98703a6c2a638360ed03b497cdf22918 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-34 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K39-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-307
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2635
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-70 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-30 |
| filingDate |
2016-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4008cfb48eeafd87d4b9992f92b48127
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_589d9eeeddc28d96272903d3da9f1585
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a46455423b05dcbfa268ab4718bac1a3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_96f65207fe86184133c266502d4b9af0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c6c57d0ea840fdbf149aff6d869bf9f8 |
| publicationDate |
2017-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2017179200-A1 |
| titleOfInvention |
Test structures for manufacturing process of organic photo diode imaging array |
| abstract |
A test structure for characterizing an organic photodiode image sensor includes, on a common substrate, at least one of a cathode sheet resistance portion; a diode capacitance portion; an OPD sheet resistance portion; a contact resistance portion; a step coverage portion; a quantum efficiency portion; a film adhesion portion; and an inkjet printing portion. |
| priorityDate |
2015-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |