| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5ff210e3d78ea49ac26c2ab3ffc01578 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0409
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-049
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-7206
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0009
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0422
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-10 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-72
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-10 |
| filingDate |
2016-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ac38f7ded1b594ea52e0740e4bc4e02b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6788c7fb17d01bf65972804be13904eb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f3b93c726be91725cbbc0ce6cfb91f9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ddd44a61d7bcabdd89c53549095bef99
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1ecb192f922393b0cbbe73510b25d077 |
| publicationDate |
2017-05-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2017148617-A1 |
| titleOfInvention |
Method for analyzing evolved gas and evolved gas analyzer |
| abstract |
Disclosed herein is a method for analyzing evolved gas and an evolved gas analyzer, the method correcting detection sensitivity differences in analysis devices, day-to-day variations thereof, thereby quantifying a measurement target with high accuracy. The method for analyzing evolved gas of the apparatus including: a sample holder; a heating unit evolving a gas component; an ion source generating ions by ionizing the gas component; a mass spectrometer detecting the gas component; and a gas channel through which mixed gas flows, the method including: operating a discharged flow rate controlling process of controlling a flow rate of the mixed gas discharged to outside; operating a sample holder cooling process of cooling the sample holder by bringing the sample holder into contact with a cooling unit; and operating a correction process including: correcting a mass spectrum position; calculating a sensitivity correction factor; and calculating a heating correction factor. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11170967-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9899198-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111795874-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9897579-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113921370-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017146497-A1 |
| priorityDate |
2015-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |