http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017115365-A1

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R33-60
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R33-12
filingDate 2016-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fabf3a4618cd31a8e1b44a0f76d4820d
publicationDate 2017-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2017115365-A1
titleOfInvention Electron Intrinsic Spin Analyzer
abstract Electron Intrinsic Spin Analyzer is designed only for observing and separating the spin of free electrons. This analyzer comprises a high vacuumed lamp and an electron Gun and a Parallel suppliers for free electrons. This invention isolated the free electrons on free space and with no any atomic constraint or material bands of energy. It is not such as monitoring systems. Free electron strips shoot to phosphorescent plate regarding some methods in this patent effects of negative ions and neutral atoms will be omitted. When free electron strips goes through magnets which create inhomogeneous (not changing with time) electromagnetic field, electrons with different spins will be separated so the free electron strip converts to two strips which are visible. According to historical note this invention shows that it is possible to observe and separating the spin of free electrons by using a very sharp pointed magnet and adjusting the voltage in a certain distance from free electron beams and by using a high vacuum lamp which is deionized well. That objective observation requires your consideration of some technical points simultaneously In this invent, no electric field and no magnetic field does not change with time. All voltages and currents are constant (DC) to remove any plasma fluctuations effect.
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priorityDate 2015-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.