http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017108424-A1

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publicationDate 2017-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2017108424-A1
titleOfInvention X-ray fluorescence spectrometer and x-ray fluorescence analyzing method
abstract An X-ray fluorescence spectrometer includes: an X-ray source ( 3 ) to irradiate, with primary X-rays ( 6 ), a sample ( 1 ) that is multiple nanoparticles placed on a substrate ( 10 ); an irradiation angle adjustment unit ( 5 ) to adjust an irradiation angle at which a surface ( 10 a ) of the substrate is irradiated; a detection unit ( 8 ) to measure an intensity of fluorescent X-rays ( 7 ) from the sample ( 1 ); a peak position calculation unit ( 11 ) to generate a sample profile representing change of the intensity of the fluorescent X-rays ( 7 ) against change of the irradiation angle, and to calculate a peak irradiation angle position; a particle diameter calibration curve generation unit ( 21 ) to generate a calibration curve; and a particle diameter calculation unit ( 22 ) to calculate a particle diameter of nanoparticles of an unknown sample ( 1 ) by applying the peak irradiation angle position of the unknown sample ( 1 ) to the calibration curve.
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