http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017108424-A1
Outgoing Links
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_388f51184566065bdf266df44d6dbd5f |
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-641 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-3037 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-0211 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
filingDate | 2016-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_357b74be5b70bbb84ff6d56dbab5fb22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ea575d3951cbe5498604e779d28084af |
publicationDate | 2017-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | US-2017108424-A1 |
titleOfInvention | X-ray fluorescence spectrometer and x-ray fluorescence analyzing method |
abstract | An X-ray fluorescence spectrometer includes: an X-ray source ( 3 ) to irradiate, with primary X-rays ( 6 ), a sample ( 1 ) that is multiple nanoparticles placed on a substrate ( 10 ); an irradiation angle adjustment unit ( 5 ) to adjust an irradiation angle at which a surface ( 10 a ) of the substrate is irradiated; a detection unit ( 8 ) to measure an intensity of fluorescent X-rays ( 7 ) from the sample ( 1 ); a peak position calculation unit ( 11 ) to generate a sample profile representing change of the intensity of the fluorescent X-rays ( 7 ) against change of the irradiation angle, and to calculate a peak irradiation angle position; a particle diameter calibration curve generation unit ( 21 ) to generate a calibration curve; and a particle diameter calculation unit ( 22 ) to calculate a particle diameter of nanoparticles of an unknown sample ( 1 ) by applying the peak irradiation angle position of the unknown sample ( 1 ) to the calibration curve. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10816488-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110487824-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023044528-A1 |
priorityDate | 2014-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID226405960 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID441244 |
Total number of triples: 23.