http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017062198-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b655f94d0cf6efeeead73cc734e0fba5 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0059 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-046 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64 |
| filingDate | 2016-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_925da0f9fefe12b74a77ae2f799516c9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_675a66f0df8ec2bd69da486fe6365248 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bfe8dc3891edc4cd6a882ab77de6c5e3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_810475f8cdf2e505dbbf272bf07157dd |
| publicationDate | 2017-03-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-2017062198-A1 |
| titleOfInvention | Hybrid extreme ultraviolet imaging spectrometer |
| abstract | A hybrid extreme ultraviolet (EUV) imaging spectrometer includes: a radiation source to: produce EUV radiation; subject a sample to the EUV radiation; photoionize a plurality of atoms of the sample; and form photoions from the atoms subject to photoionization by the EUV radiation, the photoions being desorbed from the sample in response to the sample being subjected to the EUV radiation; an ion detector to detect the photoions: as a function of a time-of-arrival of the photoions at the ion detector after the sample is subjected to the EUV radiation; or as a function of a position of the photoions at the ion detector; an electron source to: produce a plurality of primary electrons; subject the sample to the primary electrons; and form scattered electrons from the sample in response to the sample being subjected to the primary electrons; and an electron detector to detect the scattered electrons: as a function of a time-of-arrival of the scattered electrons at the electron detector after the sample is subjected to the EUV radiation or the primary electrons; or as a function of a position of the scattered electrons at the electron detector. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11164732-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111739785-A |
| priorityDate | 2015-09-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.