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publicationDate 2016-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2016225628-A1
titleOfInvention Nitridation on hdp oxide before high-k deposition to prevent oxygen ingress
abstract A method of reducing a migration of oxygen into a high-k dielectric layer of a semiconducting device is disclosed. An oxide layer of the semiconducting device is deposited on a substrate. A chemical composition of a top portion of the oxide layer is altered. The high-k dielectric layer is deposited on the top portion of the oxide layer to form the semiconducting device. The altered chemical composition of the top portion of the oxide layer reduces migration of oxygen into the high-k dielectric layer.
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