http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016172144-A1

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filingDate 2014-06-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5be5c4f25e10585a8a6a555ba1142c0e
publicationDate 2016-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2016172144-A1
titleOfInvention Activation chamber and kit used in treatment device for lowering electron affinity, treatment device that contains said kit and is used to lower electronic affinity, photocathode electron-beam source, electron gun containing photocathode electron-beam source, free-electron laser accelerator, transmission electron microscope, scanning electron microscope, electron-beam holography microscope, electron-beam lithography device, electron-beam diffraction device, and electron-beam scanning device
abstract This invention provides a treatment device for lowering electron affinity, said treatment device being capable of performing an EA surface treatment on a photocathode material or an EA surface retreatment on a photocathode, and an electron-beam device provided with said treatment device. An activation chamber ( 20 ) used in a treatment device for lowering electron affinity by vaporizing a surface-treatment material ( 30 ) and using the vaporized surface-treatment material ( 30 ) to perform an electron-affinity lowering treatment on a photocathode material ( 52 ) or an electron-affinity lowering retreatment on a photocathode ( 52 ), said activation chamber ( 20 ) being characterized by containing holes through which electrons can pass.
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