Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36f8253f3d0d59bcd9259217d4385d10 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-41766 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42368 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66734 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823481 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7397 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-1095 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7811 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7813 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7827 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-407 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-423 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-40 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 |
filingDate |
2015-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a44ea7bab085602681b5364a06097f6d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_97dd1cb6ee250e870b3282b87d0a1e3a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a39e8b1d70dea2ec3b6a25b3458bc38f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_68a73d05fb4dcc7afe81c5978dea3e04 |
publicationDate |
2016-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2016093728-A1 |
titleOfInvention |
Semiconductor Device and Method of Manufacturing the Same |
abstract |
A semiconductor device comprises a semiconductor body. The semiconductor body comprises insulated gate field effect transistor cells. At least one of the insulated gate field effect transistor cells comprises a source zone of a first conductivity type, a body zone of a second, complementary conductivity type, a drift zone of the first conductivity type, and a trench gate structure extending into the semiconductor body through the body zone along a vertical direction. The trench gate structure comprises a gate electrode separated from the semiconductor body by a trench dielectric. The trench dielectric comprises a source dielectric part interposed between the gate electrode and the source zone and a gate dielectric part interposed between the gate electrode and the body zone. The ratio of a maximum thickness of the source dielectric part along a lateral direction and the minimum thickness of the gate dielectric part along the lateral direction is at least 1.5. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9691892-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9530884-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9391194-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016093731-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10943896-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2021376124-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016218209-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019081147-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11610880-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108666361-A |
priorityDate |
2014-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |