| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_268be9afa00cf55b5aa72b1612151ecb |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-068
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-06113
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-40 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-658
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0418
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-164
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0004 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-65
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04 |
| filingDate |
2015-10-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1877d885240861019a8fd13402a95965
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c877c64a2a22b012fb85ff1708121a2f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_52155c4ca582236b25b21bbe7c4a7f9c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_26165b60efa68733903b0e886ae79569 |
| publicationDate |
2016-01-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2016027631-A1 |
| titleOfInvention |
Measurement device, measurement apparatus, and method |
| abstract |
A metal film of a measurement device including a transparent dielectric substrate is irradiated with first light from a transparent dielectric substrate side, an optical electric field enhanced by an optical electric field enhancing effect of a localized plasmon induced to a surface of the metal film by the irradiation is generated, light emitted from the transparent dielectric substrate side is detected, a specimen installed on a surface of a metal fine concavo-convex structure layer and a matrix agent are irradiated with second light from a side opposite to the side of the irradiation with the first light in a state where a voltage is applied to the metal fine concavo-convex structure layer through a voltage application electrode, an analysis target substance for mass spectrometry in the specimen is desorbed from the surface by the irradiation, and the desorbed analysis target substance is detected. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018166267-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113092374-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11075065-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10665445-B2 |
| priorityDate |
2013-04-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |