| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5846ed1722d0bb1186befbfb2b991232 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2001-0452
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2223-52
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2001-0083
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2222-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2223-55
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2210-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2222-23
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2001-005
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H2001-0883
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-1787 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H1-0866
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-0025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-1015
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-102
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03H1-041
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-4795 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B3-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B3-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03H1-08 |
| filingDate |
2014-01-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4b80333e319543dbaae8c6f1309fa448
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5c623eb4fc428ed8f476251b62ef2142
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3ee6506ea324571c84437609c81de871 |
| publicationDate |
2016-01-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2016000319-A1 |
| titleOfInvention |
Systems and methods for sub-aperture based aberration measurement and correction in interferometric imaging |
| abstract |
Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present application, a fast and simple way to correct for defocus aberration is described. A variety of applications for the method are presented. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-2733822-C1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018035883-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10231616-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11015981-B2 |
| priorityDate |
2013-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |