http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015292921-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_df74e7352f6daaa16002eec3eefa92de |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R35-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01D21-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01D21-00 |
| filingDate | 2013-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_52797bee293cee39f21f2dc897e4ee2a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_be9fac69399f19b3a2f21b3c1d589816 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_50d5befa5bb05387f8bcfbe7a32df6bd http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7f8f8fbc502ef90586465e359f2ec3c |
| publicationDate | 2015-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-2015292921-A1 |
| titleOfInvention | System and method for calibrating a measuring arrangement and characterizing a measurement mount |
| abstract | A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (S m ) from different calibration standards ( 3 ) and with associated actual scattering parameters (S a ) of the calibration standards ( 3 ) and determines linear-in-T system errors ({tilde over (T)} i ) for the calibration of a network analyzer ( 1 ) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k,p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error ({tilde over (T)} i ) or with a correct second linear-in-T system error (p kor (k) dependent upon the first linear-in-T system error (k). |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016178722-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111983538-A |
| priorityDate | 2012-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 23.