http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015253374-A1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2607
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2896
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2015-02-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_10ad9d109de9506e94ffd1139087ed8a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a6c0b2c30b866bfcd6081b3c507cbbe9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_019d82a6261b749954b446777a4350eb
publicationDate 2015-09-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2015253374-A1
titleOfInvention Chip to package interaction test vehicle and method for testing chip to package interaction using the same
abstract A chip to package interaction (CPI) test vehicle includes a chip including metal patterns contained in first and second sub-regions, respectively, and in which any one of the following comparable properties (a)˜(e) is the same among the first and second sub-regions, and another one of the properties (a)˜(e) is different among the first and second sub-regions: (a) size and shape of the sub-region, (b) metal density of the metal pattern, (c) type of the metal pattern, (d) distance between the sub-region and a center of the chip, (e) structure of the metal pattern.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11073550-B1
priorityDate 2014-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID128689896
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7452

Total number of triples: 17.