| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04L1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2015-01-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_edf29c9239d6b59ec714e2d465879e0c |
| publicationDate |
2015-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2015192638-A1 |
| titleOfInvention |
Semiconductor test device and method of operating the same |
| abstract |
A method of operating a semiconductor test device includes transferring a first device under test (DUT) from a load tray to a first load shuttle. The first DUI is transferred from the first load shuttle to a first test board and a second DUT is transferred from the load tray to a second load shuttle. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2021373076-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11782093-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111610400-A |
| priorityDate |
2014-01-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |