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publicationDate 2015-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2015011024-A1
titleOfInvention Analysis device, analysis method, film formation device, and film formation method
abstract An analysis device includes an X-ray generation part configured to generate four monochromatic X-rays with different energies to irradiate a sample, an electrically conductive sample stage configured to place the sample thereon and formed of an electrically conductive material, an electrode configured to detect an electric current carried by irradiating the sample with the four monochromatic X-rays with different energies, and an electric power source configured to apply a voltage between the electrically conductive sample stage and the electrode, wherein the four monochromatic X-rays with different energies are X-rays included within a range from an absorption edge of a compound semiconductor included in the sample to a higher energy side of 300 eV.
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