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publicationDate 2014-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2014264520-A1
titleOfInvention Integrated circuit structure and method for protection from damage to gate dielectric
abstract An integrated circuit device comprises a common-gated dual-oxide MOSFET including a protective device and a MOSFET. A common gate electrode serves as a gate electrode of the protective device and as a gate of the MOSFET. The protective device comprises a first gate dielectric having a first thickness over a first channel region and the MOSFET comprises a second gate dielectric thicker than the first gate dielectric over a second channel region. During a plasma process, a first current can flow through the first dielectric that is higher than a second current through the second dielectric.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2023187177-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023284020-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017004887-A1
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