| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fa5680c221e837d6f67cb92ce13378c2 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06738
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2221-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06788 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 |
| filingDate |
2012-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2c8bcaeba93c2658a012243d265dcf04 |
| publicationDate |
2014-07-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2014184260-A1 |
| titleOfInvention |
Conductive test probe |
| abstract |
A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020506371-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114814314-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022107343-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109419533-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10578647-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019101569-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10094858-B1 |
| priorityDate |
2012-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |