| abstract |
Method and apparatus are described for improving measurements of scattered light from particles by controlling multiple scattering and coincidence count levels. The scatter path in the particle dispersion and particle concentration are adjusted to reduce multiple scattering in ensemble particle scattering measurement. And the particle dispersion volume and particle concentration are adjusted to reduce coincidence counts in single particle scattering measurements. Alignment of the optical system, for measuring scattered light, is maintained by a reflection apparatus. |