http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014132302-A1

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Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_30451a69b6b78fc8bd9a4ca63b69a4a9
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classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2605
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-129
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2012-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4d12021950a662c31f045e0a296b331d
publicationDate 2014-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2014132302-A1
titleOfInvention Method for measuring potential induced degradation of at least one solar cell or of a photovoltaic panel as well as the use of same method in the production of solar cells and photovoltaic panels
abstract The invention relates to a method for measuring the high-voltage induced degradation (PID) of at least one solar cell. According to the invention, a conductive plastic material is pressed on the upper side or bottom side of the respective solar cell, in particular on the front side thereof, and a DC voltage greater than 50 V is applied between the plastic material and the respective solar cell. Alternatively, corona discharges may be applied to solar cells or photovoltaic modules. In one embodiment, a characteristic electric parameter of the respective solar cell or of the photovoltaic module is repeatedly measured at time intervals. The method according to the invention can be carried out on individual solar cells, which can be further processed directly after passing the test and without further complex processing, e.g. to a photovoltaic module. In principle, the method is also suitable for measurements on complete photovoltaic modules.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015101650-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016276976-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10931229-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10615741-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10547272-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9876468-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11456698-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109541429-A
priorityDate 2011-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.