| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_eae3034a505868e4f55845e3e3667646 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T29-49165
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07342 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-311
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07378
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-071
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07364 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-07 |
| filingDate |
2013-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1328a50e087a9e27dcbbd2c0d02a07d2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_35b3ef20200211914ec71324dd9065e5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f022adb0547e98c6adc8a17aaed1e555
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_22d11b8f48dae1b3117a6ef203d6b11c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b2415ce116b9df06fe76d33afb91fb08 |
| publicationDate |
2014-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2014125370-A1 |
| titleOfInvention |
Image Sensor Testing Probe Card |
| abstract |
A probe card for use in testing a wafer and a method of making the probe card include a printed circuit board (PCB) formed with a conductor pattern and a probe head in proximity to the PCB, the probe head defining at least one hole through the probe head, and the probe head being made of an electrically insulating material. At least one conductive pogo pin is disposed respectively in the at least one hole, the pogo pin having a first end electrically connected to the conductor pattern on the PCB. At least one conductive probe pin includes a cantilever portion and a tip portion. The cantilever portion is in contact with and electrically connected to a second end of the pogo pin, and the tip portion is electrically connectable to the wafer to electrically connect the wafer to the conductor pattern on the PCB. The cantilever portion of the probe pin is fixedly attached to the probe head. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022272278-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023156271-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I766650-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11736818-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015109016-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I582444-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I551844-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11284018-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106645817-A |
| priorityDate |
2012-11-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |