| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2225-06596
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T29-532
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2225-06541
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T29-5313 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L25-0657
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L25-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76898
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76886 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L25-065 |
| filingDate |
2013-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_25f116b6d257683c2c83b925f8f66f4c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7e74e6a9a4518eb6691d8fadcd3c83a3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3f2d84a5c5d379114bd5651e432563c0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fc596a52afb78f612a82f2b2038c7f34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e247bdb727107800c664c0238f478d7b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a611f5719cbde3d15cc7b160437d209f |
| publicationDate |
2014-02-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2014033519-A1 |
| titleOfInvention |
Through silicon via repair |
| abstract |
Methods and systems for altering the electrical resistance of a wiring path. The electrical resistance of the wiring path is compared with a target electrical resistance value. If the electrical resistance of the wiring path exceeds the target electrical resistance value, an electrical current is selectively applied to the wiring path to physically alter a portion of the wiring path. The current may be selected to alter the wiring path such that the electrical resistance drops to a value less than or equal to the target electrical resistance value. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11714117-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104319258-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022163580-A1 |
| priorityDate |
2011-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |