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publicationDate 2014-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2014027912-A1
titleOfInvention Sidewalls of electroplated copper interconnects
abstract A structure formed in an opening having a substantially vertical sidewall defined by a non-metallic material and having a substantially horizontal bottom defined by a conductive pad, the structure including a diffusion barrier covering the sidewall and a fill composed of conductive material. The structure including a first intermetallic compound separating the diffusion barrier from the conductive material, the first intermetallic compound comprises an alloying material and the conductive material, and is mechanically bound to the conductive material, the alloying material is at least one of the materials selected from the group of chromium, tin, nickel, magnesium, cobalt, aluminum, manganese, titanium, zirconium, indium, palladium, and silver; and a first high friction interface located between the diffusion barrier and the first intermetallic compound and parallel to the sidewall of the opening, wherein the first high friction interface results in a mechanical bond between the diffusion barrier and the first intermetallic compound.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015140809-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015235268-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9060457-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018199154-A1
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priorityDate 2012-06-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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