Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a7b097bfd3f350ed27ffa53e1f114d1a |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-655 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6484 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-653 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B1-044 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-489 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0066 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0068 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0071 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-0407 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-6852 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-4795 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0075 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0077 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0084 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B1-043 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-65 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B1-07 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B1-04 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B1-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J1-04 |
filingDate |
2013-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c2ded7e32e79cb45d5a9f04486853d33 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d33e8aa66bd30c9a8a208fce3f01a04f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1509702ccc3dbf95e3f2a0680a81aeef |
publicationDate |
2014-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2014018685-A1 |
titleOfInvention |
Optical inspection device, electromagnetic wave detection method, electromagnetic wave detection device, organism observation method, microscope, endoscope, and optical tomographic image generation device |
abstract |
An optical inspection device 1, comprising a light generation means 2, a light irradiation means 3 irradiating an object to be inspected 4 with light generated from the light generation means 2 and a photodetection means 6 photoelectrically converting signal light obtained from the object to be inspected 4 through irradiation of light by the light irradiation means 3, and inspecting the object to be inspected 4 based on output from the photodetection means 6, wherein a light amplification means 5 amplifying signal light obtained from the object to be inspected 4 is provided. There is thus provided an optical inspection device capable of photoelectically converting signal light from the object to be inspected with high sensitivity and promptly with its inexpensive configuration without increasing the intensity of light with which the object to be inspected is irradiated and without using an expensive low-noise and high-sensitivity photodetector. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9515728-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015311976-A1 |
priorityDate |
2008-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |