| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_70f3f959afeb34428d31fac76c2bc5ec
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b6188211c64d3b4205e5db64fe7ee3d8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d42a242af170723f3a39efb83703df2d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3da31bf01cfc9bc7f83c3f43659226a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cf1855c09d4d5f1b0a434f057acd975b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_49f04b1dc6b9fcc2d8b159c5ebee364b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3577 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3581
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-552 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-552
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-3586
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-3563
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35 |
| filingDate |
2012-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dcf29123c33f3b4df3db850e1c205092
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f17d79a82b1d119010d4e628e479c1b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ed7979969f10772ad419abdf4657400b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_27ca10307d27b59c9f71aded4e6e47a0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8eb45f507ab72f9ebc9ced7b44225028 |
| publicationDate |
2014-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2014008541-A1 |
| titleOfInvention |
Total reflection spectroscopic measurement method |
| abstract |
A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31 c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31 c after passing the prism 31 , wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31 c and the object 34 . A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31 c , thereby stably generating an interaction between an evanescent component and the object 34. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107271399-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014014840-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019149702-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9080913-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9696206-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015326828-A1 |
| priorityDate |
2011-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |