| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_003f631b36d3d258229bc249b7496a4a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b452283384de8cf634b663c79a7c99e7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8adbcd4779f070f603a936649a03faa5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_df658468ba6d72c9b29853a6c848869b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5256 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2012-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bd17eaa3722f474a5aa55a4bc6992ce6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c61f3307e157f90a6799c2798313858a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c3220af9b8798ceee58ba859adc57236 |
| publicationDate |
2013-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2013314120-A1 |
| titleOfInvention |
Wafer level package resistance monitor scheme |
| abstract |
An integrated circuit includes a monitoring circuit and a monitored circuit connected with the monitoring circuit. The monitoring circuit is operable to determine during fabrication if a resistance of a connection between an in-fab redistribution layer connector and a post-fab redistribution layer connector exceeds a threshold. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9099420-B2 |
| priorityDate |
2012-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |