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filingDate 2012-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9210af3ec4ef877860b81fce22a10827
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publicationDate 2013-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2013105910-A1
titleOfInvention Remote Doped High Performance Transistor Having Improved Subthreshold Characteristics
abstract Devices comprising, and a method for fabricating, a remote doped high performance transistor having improved subthreshold characteristics are disclosed. In one embodiment a field-effect transistor includes a channel layer configured to convey between from a source portion and a drain portion of the transistor when the transistor is in an active state. Further, the field-effect transistor includes a barrier layer adjacent to the channel layer. The barrier layer comprises a delta doped layer configured to provide carriers to the channel layer of the transistor, while preferably substantially retaining dopants in said delta-doped layer.
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